Environmental Conditions


Specifications
Operating Temperature range-40°C to 71°C
Storage Temperature range-40°C to 85°C
Humidity (% rh)Max 85%Non-condensing
Operating Vibration 20Hz to 2000 Hz; 10g RMS

MIL-STD-810

Device shall be mechanically isolated from high frequency vibrations above 2 kHz.

Operating shocks survivability> 30g 11ms (powered on)

Highest powered-on test performed.  Survivability higher ; contact us if you need additional tests

MTBF50 000 hours

Ground Mobile (GM)

MIL-HDBK-217 part count method + Supplier MTBF

EMC


StandardDescription
EN 60945:2002, COR1:2008Maritime navigation and radiocommunication equipment and systems – General requirements – Methods of testing and required test results
StandardDescriptionSpecificationsCriteriaVerdict
EN 61000-4-2a: 2009Electrostatic discharge±6kV contactBCompliant
±8kV AirBCompliant
EN 61000-4-3a: 2020Electromagnetic fieldsFrequency (MHz)Severity (V/m)ACompliant
80 MHz - 2.0 GHz10 V/m
2.0 GHz - 6 GHz3 V/m
50 kHz - 80 MHz3 V/m
EN 61000-4-4 2013Fast transient bursts common mode1 kV (5/50ns 5kHz)BCompliant
EN 61000-4-6a: 2014Currents induced by radio-frequency fields10 V/m (fréquences de spots: 2 MHz, 3 MHz, 4 MHz, 62 MHz, 82 MHz, 126 MHz, 165 MHz, 188 MHz, 22 MHz, 25 MHz)ACompliant
EN 61000-4-8: 2010Magnetic field immunity3 A/m (50 Hz / 60 Hz)ACompliant
EN 61000-4-11*a: 2020Voltage interruptions60s (3 interruptions)CCompliant
EN 55016-1-2Conducted EmissionsFrequency (MHz)Quasi-peak limit (dBµV)BCompliant
0.01 - 0.15 MHz96 - 50
0.15 - 0.3560 - 50
0.35 - 3050
EN 55016-1-4Radiated EmissionsFrequency (MHz)Peak Limit (dBµV/m)Average Limit (dBµV/m)Quasi-peak Limit (dBµV/m)BCompliant
0.15 - 0.3--80 - 52
0.3 - 30--52 - 34
30 - 2000--54
Except (156 - 165)30-24
Operating CriteriaExpected Performances
AThe ME must continue to operate as intended during and after the test.
No performance degradation or loss of function is allowed, relative to the specific hardware standard and the technical specification published by the manufacturer.
BThe ME must continue to operate as intended after the test.
No performance degradation or loss of function is allowed, as specified in the applicable hardware standard and the technical specification published by the manufacturer.
During the test, degradation or loss of function or performance that can self-correct is permitted; however, no modification of the actual operating state or recorded data is allowed.
CTemporary degradation or loss of function or performance is permitted during and after the test if the function self- corrects or can be restored by operating the controls as specified in the applicable hardware standard and the technical specification published by the manufacturer.